By: Denge Teknik
Price:Available on request
This is a cost-effective and reliable XRF instrument that redesigns classic pin diode detector technology with modern software and hardware. With its high-speed analysis, robust design and wide elemental range, it is used in alloy analysis, as well as in precious metals, soil, mining and catalyst applications.
It provides real-time data transfer via Bluetooth, Wi-Fi and USB connections, while its built-in cameras allow for sample imagery and photographic documentation.
Features:
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Title |
Information |
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Device Name |
SciAps X-50 |
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Technology |
XRF (X-Ray Fluorescence)—PIN Diode Detector |
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Weight & Dimensions |
1.4 kg – 238 x 283 x 84 mm |
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Application Areas |
Alloy analysis, precious metals, mining, soil, automotive catalysts. |
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Elements Analyzed (Standard Package) |
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, W, Ta, Hf, Re, Se, Au, Pb, Bi, Zr, Mo, Pd, Ag, Cd, Sn, Sb (optional additions can be made) |
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Key Features |
Fast and accurate results, durable design, Wi-Fi/Bluetooth/USB connectivity, Android interface, dual cameras. |
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Measurement Technology |
40 kV X-ray tube, 7 mm² PiN detector, 200 eV resolution. |
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Connectivity & Data Management |
Wi-Fi, Bluetooth, USB, SciAps Cloud integration. |
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User Experience |
Touchscreen, photo documentation, QR/barcode reading. |
Key Features:
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